Title:
LUMINANCE MEASURING METHOD, LUMINANCE MEASURING DEVICE AND IMAGE QUALITY ADJUSTMENT TECHNOLOGY EMPLOYING THE SAME
Document Type and Number:
Japanese Patent JP2015115726
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a luminance measuring method capable of accurately measuring the luminance of each of pixels while suppressing the overlap of images of pixels on a display panel and the influence of moire on an imaging plane of a camera.SOLUTION: A luminance measuring method includes the steps of: lighting on pixels of a part of a display panel 2 in such a manner that images of pixels on the display panel 2 are not overlapped with each other on an imaging plane of a camera 7 including a solid-state imaging device; capturing an image while enlarging the image until suppressing moire by means of the camera 7; lighting on remaining pixels on the display panel 2 in such a manner that images of pixels on the display panel 2 are not overlapped with each other on the imaging plane; capturing an image while enlarging the image until suppressing the moire by means of the camera 7; and calculating the luminance of all the pixels on the display panel 2 on the basis of the image captured for the partial pixels on the display panel 2 and the image captured for the remaining pixels.
Inventors:
MURASE HIROSHI
Application Number:
JP2013255505A
Publication Date:
June 22, 2015
Filing Date:
December 10, 2013
Export Citation:
Assignee:
IIX INC
International Classes:
H04N17/04; G09G3/20; H04N5/225; H04N17/02
Domestic Patent References:
| JP2012085225A | 2012-04-26 | |||
| JP2009521722A | 2009-06-04 | |||
| JPH06186504A | 1994-07-08 | |||
| JPH0239110U | 1990-03-15 | |||
| JP2004032509A | 2004-01-29 | |||
| JPH06202045A | 1994-07-22 | |||
| JPH05161058A | 1993-06-25 |
Foreign References:
| WO2011151866A1 | 2011-12-08 |
Attorney, Agent or Firm:
Junichi Matsuda
Suguru Ito
Nishimura Kimiyoshi
Suguru Ito
Nishimura Kimiyoshi