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Title:
MAGNETIC FIELD CALIBRATION METHOD OF THERMOMETER HAVING MAGNETIC FIELD DEPENDENCY
Document Type and Number:
Japanese Patent JP3416685
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a method capable of executing easily magnetic field calibration of a thermometer having magnetic field dependency.
SOLUTION: A temperature dependence characteristic of a physical property value of material having the physical property value having no magnetic field dependency is measured (procedure 1), and the material and the thermometer to be subjected to the magnetic field calibration having the magnetic field dependency are kept at the same temperature at each temperature in the magnetic field (procedure 2), and the indicated temperature of the thermometer is acquired, and the physical property value is measured by a measuring method having no magnetic field dependency (procedure 3). The temperature is determined from the physical property value and the temperature dependence characteristic of the physical property value, and magnetic field calibration values of the thermometer having the magnetic field dependency at each temperature in the magnetic field are determined from the temperature and the indicated temperature (procedure 4).


Inventors:
Tanaka, Kosuke
Iyo, Akira
Shirakawa, Naoki
Ikeda, Shinichi
Ihara, Hideo
Tokiwa, Kazuyasu
Watanabe, Tsuneo
Kamimura, Akira
John III, Ellis Macarthur
Application Number:
JP2000000386049
Publication Date:
April 11, 2003
Filing Date:
December 19, 2000
Export Citation:
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Assignee:
JAPAN SCIENCE & TECHNOLOGY CORP
QUANTUM DESIGN JAPAN INC
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY
International Classes:
G01K7/36; G01K15/00; (IPC1-7): G01K15/00
Attorney, Agent or Firm:
平山 一幸