Title:
MAGNETIC FIELD PROBE AND MAGNETIC FIELD MEASURING METHOD USING THE SAME
Document Type and Number:
Japanese Patent JP3039429
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To measure a magnetic field accurately without being affected by the installation angle of a magnetic field probe.
SOLUTION: Two semi-rigid cables 2a and 2b are used and gaps 4a and 4b being formed at a joint part between the semi-rigid cables 2a and 2b and a copper rod 3 are formed at the both edges of a loop part. In a phase device 6, an output voltage from the semi-rigid cable 2a and an output voltage where the phase of an output voltage from the semi-rigid cable 2b is inverted are synthesized and outputted.
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Inventors:
Eiji Hankui
Application Number:
JP7374197A
Publication Date:
May 08, 2000
Filing Date:
March 26, 1997
Export Citation:
Assignee:
NEC
International Classes:
G01R33/02; G01R29/08; (IPC1-7): G01R33/02; G01R29/08
Domestic Patent References:
| JP560815A | ||||
| JP9153725A | ||||
| JP57192877A | ||||
| JP5034142A | ||||
| JP4138281U | ||||
| JP61161772U |