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Title:
MAGNETIZING APPARATUS FOR MAGNETIC FLAW DETECTION
Document Type and Number:
Japanese Patent JP2013160647
Kind Code:
A
Abstract:

To provide a magnetizing apparatus for magnetic flaw detection capable of immediately demagnetizing remanence of a test object after a magnetic flaw detection.

When a changeover switch 4 is turned on, an amplifier circuit 23 generates a magnetization AC from a DC output from a battery 21 and boosted by a booster circuit 22, and a magnetization sinusoidal AC output from a sine wave generating circuit 24, and outputs it to a magnetization coil 12. When the changeover switch 4 is turned from the on state to an off state, the sine wave generating circuit 24 outputs a demagnetization sinusoidal AC attenuating with time, to the amplifier circuit 23. The amplifier circuit 23 generates a demagnetization AC on the basis of the DC boosted by the booster circuit 22 and the demagnetization sinusoidal AC to output it to the magnetization coil 12.


Inventors:
KANEKAWA SHOTAI
HIRAYAMA MASAHIRO
Application Number:
JP2012023192A
Publication Date:
August 19, 2013
Filing Date:
February 06, 2012
Export Citation:
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Assignee:
TOKYO ENERGY & SYSTEMS INC
ERUTERU KK
International Classes:
G01N27/82; H01F13/00
Domestic Patent References:
JP2009133786A2009-06-18
JP2007033043A2007-02-08
JPH1123536A1999-01-29
JP2010249764A2010-11-04
JP2006084225A2006-03-30
JPS5928654A1984-02-15
JPH0560510A1993-03-09
Foreign References:
US4290016A1981-09-15
Attorney, Agent or Firm:
Noboru Watanabe
Harada Sanjugi