To provide a magnetizing apparatus for magnetic flaw detection capable of immediately demagnetizing remanence of a test object after a magnetic flaw detection.
When a changeover switch 4 is turned on, an amplifier circuit 23 generates a magnetization AC from a DC output from a battery 21 and boosted by a booster circuit 22, and a magnetization sinusoidal AC output from a sine wave generating circuit 24, and outputs it to a magnetization coil 12. When the changeover switch 4 is turned from the on state to an off state, the sine wave generating circuit 24 outputs a demagnetization sinusoidal AC attenuating with time, to the amplifier circuit 23. The amplifier circuit 23 generates a demagnetization AC on the basis of the DC boosted by the booster circuit 22 and the demagnetization sinusoidal AC to output it to the magnetization coil 12.
HIRAYAMA MASAHIRO
ERUTERU KK
JP2009133786A | 2009-06-18 | |||
JP2007033043A | 2007-02-08 | |||
JPH1123536A | 1999-01-29 | |||
JP2010249764A | 2010-11-04 | |||
JP2006084225A | 2006-03-30 | |||
JPS5928654A | 1984-02-15 | |||
JPH0560510A | 1993-03-09 |
US4290016A | 1981-09-15 |
Harada Sanjugi
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