Title:
MAIN SCANNING POSITION MEASURING SYSTEM AND MAIN SCANNING POSITION MEASURING METHOD
Document Type and Number:
Japanese Patent JP3820078
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a main scanning position measuring system and a main scanning position measuring method in which working efficiency and operability are good, and the measuring time is short.
SOLUTION: The main scanning position measuring system is a system for measuring a scanning position in the main scanning direction of a laser beam. The system has a scale in which a plurality of portions to transmit incident light of the laser beam and a plurality of portions to shield the incident light of the laser beam are formed alternately and continuously, a diffusion plate for observing the laser beam passed from the portions to transmit the incident light of the scale, a control means which performs the modulation control of the laser beam continuously so that it has a state of wholly shielding the incident light of the laser beam in the portions of the scale to shield at a main scanning position measurement, and a moving means which moves the scale in parallel in the direction parallel to the main scanning direction by a prescribed amount until the laser beam in the state wholly shielded in the portions of the scale to shield passes from the portions of the scale to transmit. Then, the deviation between a scanning position in the main scanning direction indicated by plotting data and a real scanning position is measured.
Inventors:
Takashi Okuyama
Application Number:
JP2000117805A
Publication Date:
September 13, 2006
Filing Date:
April 19, 2000
Export Citation:
Assignee:
Pentax Co., Ltd.
International Classes:
G01B11/00; G02B26/10; (IPC1-7): G02B26/10; G01B11/00
Domestic Patent References:
| JP9174917A | ||||
| JP1169213U | ||||
| JP6229722A |
Attorney, Agent or Firm:
Shuhei Matsuoka