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Title:
MALFUNCTION DETECTING CIRCUIT FOR AMPLIFYING CIRCUIT
Document Type and Number:
Japanese Patent JPS56116177
Kind Code:
A
Abstract:

PURPOSE: To inspect improper operation of amplifiers connected to read-in photodetectors for card readers, by giving light to all the photodetectors at the same time judging the response of the amplifiers.

CONSTITUTION: The photodetectors receive photoradiation at the same time, and the output of the amplifier at that time is input to the OR circuit 1 and the NAND circuit 2. The output (a) of the OR circuit 1 is at 1 with the output of fastest amplifier. The output (b) of the NAND circuit 2 is at 1, if no output is obtained from one amplifier and at 0 is output is obtained from all the amplifiers. After the output (a) is at 1, the detection pulse generating circuit 3 makes the output (d) to 1 after the time preset as the range of error of instantaneous operation (mainly rising time) of the amplifier. The AND gate 4 outputs 1 if the output (b) is as yet 1 when the output (d) is at 1 to set FF5 and to output error output. Thus, the defective operation of amplifier can be konwn.


Inventors:
ITOU HIDEO
Application Number:
JP1778380A
Publication Date:
September 11, 1981
Filing Date:
February 18, 1980
Export Citation:
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Assignee:
NIPPON ELECTRIC CO
International Classes:
G06K7/00; G06K7/10; H03K5/153; H03K5/26; (IPC1-7): G06K7/10; H03K5/153



 
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