Title:
MALFUNCTION SIGN DETECTING DEVICE, MALFUNCTION SIGN DETECTING METHOD, AND, MALFUNCTION SIGN DETECTING PROGRAM
Document Type and Number:
Japanese Patent JP2019053486
Kind Code:
A
Abstract:
To highly precisely detect a sign of malfunction before a storage device becomes malfunction.SOLUTION: A malfunction sign detecting device 40 includes: a creating unit 41 that creates an inspection access request to a storage device 50 at a predetermined first timing and a second timing later than the first timing; a collecting unit 42 that collects, for each inspection access request, information indicating activation characteristics when the storage device 50 is activated in response to the inspection access request; a storing unit 43 that stores first activation characteristic information indicating the activation characteristics at the first timing and second activation characteristic information indicating the activation characteristics at the second timing; and a creating unit 44 that creates deterioration information indicating a deteriorated status of the storage device 50 by obtaining a difference between the first activation characteristic information and the second activation characteristic information.SELECTED DRAWING: Figure 4
Inventors:
IIDA TAKASHI
Application Number:
JP2017176812A
Publication Date:
April 04, 2019
Filing Date:
September 14, 2017
Export Citation:
Assignee:
NEC PLATFORMS LTD
International Classes:
G06F11/30; G06F3/06; G06F11/00; G06F11/07; G06F11/22; G06F11/34; G11B20/18
Domestic Patent References:
JP2007335012A | 2007-12-27 | |||
JP2008084392A | 2008-04-10 | |||
JP2000322810A | 2000-11-24 | |||
JP2010277638A | 2010-12-09 | |||
JP2009175818A | 2009-08-06 | |||
JP2007011687A | 2007-01-18 | |||
JP2010157266A | 2010-07-15 |
Attorney, Agent or Firm:
Masahiko Desk
Naoki Shimosaka
Naoki Shimosaka