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Patent Searching and Data


Title:
MANUFACTURE OF EPITAXIAL WAFER
Document Type and Number:
Japanese Patent JP10050616
Kind Code:
A
Abstract:

To provide a manufacturing method epitaxial wafer with high- productivity, wherein steep and stable resistivity profile can be produced with narrow transition width.

In method for gas phase growth of a desired silicon single crystal layer 3 on a silicon single crystal 1 placed in a reaction vessel 1, a process in which after a protective film 4 of a silicon single crystal thin film is gas-phase-grown on the silicon single crystal 1, the inside of the reaction vessel is dry-etched, while the silicon single crystal 1 on which the protective layer 4 is gas-phase-grown is housed in the reaction vessel, a process for purging inside the reaction vessel, and a process where the desired silicon single crystal layer 3 is gas-phase-grown, are provided.


Inventors:
Ose, Hiroki
Application Number:
JP1996000200689
Publication Date:
February 20, 1998
Filing Date:
July 30, 1996
Export Citation:
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Assignee:
SHIN ETSU HANDOTAI CO LTD
International Classes:
C30B29/06; C30B25/02; C30B31/06; H01L21/205; H01L21/336; H01L29/739; H01L29/78; (IPC1-7): H01L21/205; C30B29/06; C30B31/06; H01L29/78; H01L21/336