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Title:
MANUFACTURE OF PHOTOMASK
Document Type and Number:
Japanese Patent JPS58132746
Kind Code:
A
Abstract:

PURPOSE: To shorten a time required for an etching process, and to obtain a glass mask having a minute and high-accuracy pattern with good reproducibility, by removing a chromium oxide layer by wet etching and the remaining chromium layer by plasma etching in etching a chromium layer having 2 layer structure and low reflectivity.

CONSTITUTION: A resist film 4 is patternwise exposed with electron beams, to form a pattern on a plate, the plate is subjected to wet etching to remove the image lines of a chromium oxide film 3, then, the resist film is removed, and finally, a chromium film 2 is etched by plasma etching to obtain the remaining chromium oxide film 3' as a mask for etching.


Inventors:
NAKAGAWA KATSUNOBU
Application Number:
JP1608582A
Publication Date:
August 08, 1983
Filing Date:
February 03, 1982
Export Citation:
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Assignee:
MATSUSHITA ELECTRONICS CORP
International Classes:
G03F1/00; G03F1/68; G03F1/80; H01L21/027; (IPC1-7): G03F1/00; H01L21/30
Attorney, Agent or Firm:
Toshio Nakao



 
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