Title:
MANUFACTURING METHOD OF APPEARANCE LIMIT SAMPLE TOOL, AND APPEARANCE LIMIT SAMPLE TOOL
Document Type and Number:
Japanese Patent JP2016161398
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a manufacturing method of an appearance limit sample tool that can easily and inexpensively manufacture an appearance limit sample tool and can easily form various appearance limit samples.SOLUTION: The manufacturing method of an appearance limit sample tool 10 having a defect sample includes a defect sample formation process of pressing an instrument onto a surface of a transparent optical member 11, concentrating a plurality of impressions, and forming a first defect sample 13. Preferably, after the defect sample formation process, the method includes a coating process of coating the surface of a transparent optical member 11 with a coating layer 12.SELECTED DRAWING: Figure 1
Inventors:
YASUMOTO YOSHI
Application Number:
JP2015040272A
Publication Date:
September 05, 2016
Filing Date:
March 02, 2015
Export Citation:
Assignee:
MURAKAMI CORP
International Classes:
G01N21/93; C03B23/02; C03C17/245; G01N21/84; G02B3/00; G09F5/04
Attorney, Agent or Firm:
Isono International Patent and Trademark Office
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