To provide an inspection method and an inspection device of a sealing material required for an electrooptical device for highly reliably and efficiently manufacturing the electrooptical device.
The electrooptical device can be highly reliably and efficiently manufactured by using the sealing material shape inspection device evaluating the sealing material required for the electrooptical device based on a previously set standard for the sealing material and by evaluating and outputting information on the sealing material extracted and obtained by the inspection device, that is, the quality and the physical property data of the shape of the sealing material to the other devices. In the quality of the shape of the sealing material, when the quality of the shape of the sealing material is satisfactory, an electrooptical material is dropped and when the quality is defective, the electrooptical material is not dropped, or the quantity of the electrooptical material to be dropped is changed to satisfactorily control the thickness of the electrooptical material.
Fujitsuna Hideyoshi
Osamu Suzawa