Title:
MANUFACTURING METHOD OF ELECTROOPTICAL DEVICE, ELECTROOPTICAL DEVICE, ELECTRONIC DEVICE, AND MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE
Document Type and Number:
Japanese Patent JP2006343469
Kind Code:
A
Abstract:
To reduce pattern abnormality by removing foreign materials sticking to a resist film.
The resist film 301 is washed by using a washing liquid to remove (S6)foreign materials such as potassium bromide sticking to the resist film 301. Since the foreign material is not limited to potassium bromide and different foreign materials stick to the resist film 301 depending on conditions of various processes, it is possible to wash the resist film by using a washing liquid suitable to remove the foreign materials from the resist film 301. For example, the washing liquid whose pH value is adjusted so that the foreign materials sticking to the resist film 301 can be removed can be used to wash the resist film 301.
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Inventors:
OGAWA AKIHIRO
KAMIDOI SUSUMU
KAMIDOI SUSUMU
Application Number:
JP2005168076A
Publication Date:
December 21, 2006
Filing Date:
June 08, 2005
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G09F9/00; G02F1/13; G02F1/1362
Domestic Patent References:
JP2002123185A | 2002-04-26 | |||
JP2005128309A | 2005-05-19 | |||
JP2000260746A | 2000-09-22 |
Attorney, Agent or Firm:
Tatsuo Egami
Satoshi Nakamura
Satoshi Nakamura
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