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Title:
MARKING METHOD OF DEFECTIVE INLET SHEET
Document Type and Number:
Japanese Patent JP2008250764
Kind Code:
A
Abstract:

To provide a marking method of a defective inlet sheet for preventing an inlet sheet with a malfunction from being erroneously shipped as an IC tag.

In the process for manufacturing an inlet sheet for non-contact IC tags with an IC chip 3 mounted thereon, provided with a transmitting/receiving function, a processing function and a storing function in the antenna pattern formed in a base film for an inlet, the marking method of a defective inlet sheet 1 performs inspection in each unit inlet of continuous inlets 1 in the form of webs in a step after or before attaching the IC chip 3 to an antenna pattern 2, and when a rejection determination is made, the marking method performs marking by conductive material in each inlet sheet of the detected rejected inlet unit.


Inventors:
IMAIZUMI KIYOSHI
Application Number:
JP2007092268A
Publication Date:
October 16, 2008
Filing Date:
March 30, 2007
Export Citation:
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Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G06K19/077; G06K19/07
Domestic Patent References:
JP2003076946A2003-03-14
JP2001043338A2001-02-16
JPH10293827A1998-11-04
Attorney, Agent or Firm:
Satoshi Kanayama
Keiko Fukamachi
Hideo Ito
Hiromi Fujimasu
Naoki Goto