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Patent Searching and Data


Title:
MASK AND ITS MANUFACTURING METHOD AND EXPOSING METHOD
Document Type and Number:
Japanese Patent JP2003121981
Kind Code:
A
Abstract:

To provide a mask which can increase the speed of lithography processing by making it possible to perform double-exposure operation using a combination of different phase shit methods without replacing a mask, and its manufacturing method and exposing device.

The mask 1 has at least two exposure patterns parts 2 and 3 and is used to form a desired pattern image by exposing the exposure pattern parts to an exposed body; and the mask has a 1st exposure area 2 having a Levenson phase shift pattern so formed that light beams passing through two adjacent light transmission parts have a phase difference and a 2nd exposure area having a half-tone phase shift pattern so formed that a light transmission part and a translucent part having specific light transmissivity are formed and light beams passing through the light transmission part and translucent part have a phase difference.


Inventors:
ISHIKAWA KIICHI
Application Number:
JP2001322293A
Publication Date:
April 23, 2003
Filing Date:
October 19, 2001
Export Citation:
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Assignee:
SONY CORP
International Classes:
G03F1/30; G03F1/32; G03F1/34; G03F1/68; G03F7/20; H01L21/027; (IPC1-7): G03F1/08; G03F7/20; H01L21/027
Attorney, Agent or Firm:
Takahisa Sato