Title:
MASS ANALYSIS DATA PROCESSING DEVICE AND MASS ANALYSIS DATA PROCESSING METHOD
Document Type and Number:
Japanese Patent JP2016031323
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To improve efficiency of a confirmation work of a plurality of mass spectra acquired by performing scan measurement by MS(n is an integer equal to or more than 2) under a plurality of measurement conditions on a sample containing an unknown component.SOLUTION: A mass analysis data processing device processes data constituting a plurality of mass spectra acquired by performing scan measurement by MS(n is an integer equal to or more than 2) under a plurality of different conditions to an unknown component contained in a sample. The mass analysis data processing device includes: a determination condition input unit 43 to which an analyzer inputs determination conditions regarding a maximum value of intensity of a mass peak on the mass spectra for selecting a mass spectrum effective to estimate the unknown component among the plurality of mass spectra; a determination execution unit 44 which determines whether or not each of the plurality of mass spectra satisfies the determination conditions; and a selection result presentation unit 45 which selects a mass spectrum determined to satisfy the determination conditions by the determination execution unit 44, and present it to the analyzer.SELECTED DRAWING: Figure 1
Inventors:
MAEDA KENGO
Application Number:
JP2014154532A
Publication Date:
March 07, 2016
Filing Date:
July 30, 2014
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01N27/62
Domestic Patent References:
| JP2004251830A | 2004-09-09 |
Foreign References:
| WO2006106724A1 | 2006-10-12 | |||
| US20120158318A1 | 2012-06-21 |
Attorney, Agent or Firm:
Kyoto International Patent Office
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