Title:
MASS ANALYSIS METHOD AND DEVICE THEREOF
Document Type and Number:
Japanese Patent JP3325426
Kind Code:
B2
Abstract:
PURPOSE: To provide a high-speed and high-resolution ion trap mass analyzer by controlling an auxiliary voltage, an amplitude factor of a high frequency voltage, and a scan speed of a high frequency voltage amplitude.
CONSTITUTION: An ion trap is composed of a ring electrode 6, and two end cap electrodes 7, 8 disposed to face each other having the ring electrode 6 between them. A sample as subject to mass analysis which passes from a sample source 1 through a sample introducing part 2 to be injected to space between the electrodes collides with an electron getting through a center port 12 of the end cap electrode 7 into the space between the electrodes to be ionized. By a main power supply 4 for operation, a quadrupole electric field is generated in the space 15 between the electrodes by a DC voltage U and a high frequency voltage Vcos Ωt supplied into between the end cap electrodes 7, 8 and the ring electrodes 6. For causing resonance of ions as subject to detection to be radiated, a separate voltage from the quadrupole electric field to generate a micro-electric field is applied to between the end cap electrodes 7, 8 by an auxiliary voltage source 11, and a control part 3 adjusts an amplitude ratio between the resonance voltage and the high frequency voltage, and determines mass scan speed to radiate the ions from a detection port 13 in accordance with necessary resolution for each ion as subject to detection.
Inventors:
Kiyomi Yoshinari
Youichi Kose
Yoshiaki Kato
Youichi Kose
Yoshiaki Kato
Application Number:
JP8707195A
Publication Date:
September 17, 2002
Filing Date:
April 12, 1995
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01N27/62; H01J49/42; (IPC1-7): H01J49/42
Domestic Patent References:
| JP63313460A | ||||
| JP5121042A | ||||
| JP2103856A | ||||
| JP61179051A |
Attorney, Agent or Firm:
Kiyoshi Maruyama (7 outside)