Title:
MASS ANALYSIS METHOD USING FINE METAL PARTICLES
Document Type and Number:
Japanese Patent JP2010185886
Kind Code:
A
Abstract:
To provide a new mass analysis method capable of accurately analyzing with a high sensitivity a chemical reaction on the surface of a self-organization film combined with a metal, and applicable to a future analysis of a sugar chain structure.
The present technology provides a method for performing a mass analysis of organic residual derivatives containing sulfur atoms, the method ionizing the organic residual derivatives containing the sulfur atoms out of a metal-organic residue complex resulting from combining a metal with the organic residue through the sulfur atom, thereby solving the problems.
Inventors:
NAGAHORI NORIKO
NIIKURA KENICHI
NISHIMURA SHINICHIRO
NIIKURA KENICHI
NISHIMURA SHINICHIRO
Application Number:
JP2010125259A
Publication Date:
August 26, 2010
Filing Date:
May 31, 2010
Export Citation:
Assignee:
SHIONOGI & CO
International Classes:
G01N27/62; C07C323/12; C07C323/25; C07D339/04; C07H15/04; C07H15/08; G01N33/483
Domestic Patent References:
| JPH07325083A | 1995-12-12 | |||
| JP2003194820A | 2003-07-09 | |||
| JP2004501340A | 2004-01-15 |
Attorney, Agent or Firm:
Hidesaku Yamamoto
Takaaki Yasumura
Natsuki Morishita
Takaaki Yasumura
Natsuki Morishita