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Title:
MASS MEASURING METHOD AND MASS MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2013024562
Kind Code:
A
Abstract:

To provide a mass measuring method which can accurately measure the mass of a droplet or a solid in the droplet dripped by an ink jet system, and a mass measuring apparatus.

In a mass measuring method, a droplet to be measured is dripped from an IJ head (12) to a crystal oscillator (14) that is oscillated, resonance frequencies F1, F2 before and after depositing the droplet to be measured to the crystal oscillator are measured and the mass of the droplet or a solid contained in the droplet is calculated on the basis of a difference of F1, F2. Total volume V of droplets to be measured represented with a surface area AQ of an electrode (42) of the crystal oscillator, a resonance frequency F in the case where no droplet is deposited, viscosity η of the droplet and a density ρ of the droplet satisfies V≤AQ×{η/(π×ρL×F)}1/2. After droplets to be measured are not matched and the preceding droplet reaches an equilibrium state, the next droplet is dripped, and the resonance frequency F1 before depositing the droplet to be measured is measured. After the preceding droplet reaches the equilibrium state, the resonance frequency F2 after depositing that droplet is measured.


Inventors:
MATAKI YUJI
Application Number:
JP2011156017A
Publication Date:
February 04, 2013
Filing Date:
July 14, 2011
Export Citation:
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Assignee:
FUJIFILM CORP
International Classes:
G01G3/16
Attorney, Agent or Firm:
Kenzo Matsuura