Title:
質量分析装置および質量分析方法
Document Type and Number:
Japanese Patent JP5039656
Kind Code:
B2
Abstract:
Provided is a mass spectroscope employing electron capture dissociation wherein the peak number of detectable fragment ions is increased. The mass spectroscope comprises an ion source (2) for generating ions from a sample, an ion trap (3) for storing and selecting ions, an ion dissociation section (4) performing electron capture dissociation on ions, and a time-of-flight mass spectrometry section (7) performing mass spectrometry on ions, wherein the reaction time of electron capture dissociation is variable depending on the valence of ions subjected to mass spectrometry.
Inventors:
Shinji Yoshioka
Akihiro Takeda
Master Fawn Tsukasa
Akihiro Takeda
Master Fawn Tsukasa
Application Number:
JP2008191580A
Publication Date:
October 03, 2012
Filing Date:
July 25, 2008
Export Citation:
Assignee:
Hitachi High-Technologies Corporation
International Classes:
G01N27/64; H01J49/06; H01J49/40; H01J49/42
Domestic Patent References:
| JP2008096353A | ||||
| JP2005091344A | ||||
| JP2006185781A | ||||
| JP2006351532A |
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Yuji Toda