Title:
質量分析装置及び質量分析方法
Document Type and Number:
Japanese Patent JP7173326
Kind Code:
B2
Abstract:
A mass spectrometer includes an ionization unit, a mass separation unit, a detection unit, a first measurement control unit configured to control the ionization unit to repeatedly execute a first measurement on a target sample while changing values of a plurality of parameters defined as device parameters, a second measurement control unit configured to control the ionization unit to set a value of each of the plurality of parameters to a predetermined reference value and execute a second measurement on the target sample at two or more time points before, after, or in a middle of repetition of the first measurement, a correction processing unit configured to correct results of the first measurements using results of the second measurements, and a device parameter-related information acquisition unit configured to determine the plurality of parameters using the corrected measurement results or acquire reference information for determining the plurality of parameters.
Inventors:
Yusuke Tagawa
Yuki Ishikawa
Yuki Ishikawa
Application Number:
JP2021524587A
Publication Date:
November 16, 2022
Filing Date:
June 06, 2019
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/26; G01N27/62; H01J49/00; H01J49/10
Domestic Patent References:
| JP2018156879A | ||||
| JP582080A |
Foreign References:
| WO2016125271A1 |
Attorney, Agent or Firm:
Kyoto International Patent Office
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