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Title:
質量分析装置
Document Type and Number:
Japanese Patent JP4335106
Kind Code:
B2
Abstract:

To provide a mass spectroscope capable of obtaining detailed structural information on components as an object for analysis, while realizing restraint of jumboizing of a device and shortening of measurement time.

A 3DQ part is formed with an end-cap electrode 2, a ring electrode 3, and an insulator 4, and a gas lead-in port 8 is formed at the insulator 4. A gas lead-in path 7 branched into a plurality of tubes is connected to the gas lead-in port 8. Each branched tube is connected to a collision gas generating device 5 through a mass-flow meter 6. Each collision gas generating device 5 has different kinds of collision gas sealed, a mixed-gas flow volume is set by the mass-flow meter 6, the gas is mixed in the path 7, and then led into the 3DQ. First, xenon is picked up as the gas, and an MS/MS measurement is started. Since a molecular volume of the object for analysis is diminished with the lapse of time, helium is mixed in the led-in gas and a gas-kind ratio is graded. With one time of the MS/MS method using a single collision cell, polymers down to low-molecule components are efficiently cleft, and a structural information of each molecule can be obtained.

COPYRIGHT: (C)2006,JPO&NCIPI


Inventors:
Masaki Yoshie
Shinji Yoshioka
Koda
Master Fawn Tsukasa
Application Number:
JP2004278670A
Publication Date:
September 30, 2009
Filing Date:
September 27, 2004
Export Citation:
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Assignee:
Hitachi High-Technologies Corporation
International Classes:
H01J49/02; G01N27/62; H01J49/26
Domestic Patent References:
JP2005243426A
JP5082080A
JP61292847A
Attorney, Agent or Firm:
Kasuga Toshiaki