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Title:
MASS SPECTROSCOPE AND MASS SPECTROMETRY
Document Type and Number:
Japanese Patent JP2022127858
Kind Code:
A
Abstract:
To provide a mass spectroscope and a mass spectrometry with which it is possible to improve a processing speed while improving a mass resolution.SOLUTION: A mass spectroscope 1 comprises: a specimen support 2; an irradiation unit 3 for irradiating a specimen S with an energy ray L1 and ionizing a component S1 of the specimen S while retaining the position information of the specimen S in the region irradiated with the energy ray L1; an extraction electrode 11 for extracting an ionized specimen S2 from the surface of the specimen S by a potential difference with the specimen support 2; an MCP 41 for ejecting electrons E that correspond to the ionized specimen S2; an imaging unit 43 for acquiring an image based on the electrons E ejected by the MCP 41; and a control unit 5 for controlling the operation of the irradiation unit 3, extraction electrode 11 and imaging unit 43. The control unit 5 causes the potential of the extraction electrode 11 to change at a timing appropriate for a detection target component after irradiation with the energy ray L1 by the irradiation unit 3, and causes the imaging unit 43 to acquire an image as the target to analyze in a period appropriate for the detection target component.SELECTED DRAWING: Figure 1

Inventors:
HIRAO TAKESHI
NAITO YASUHIDE
KOSUGI NORIMASA
Application Number:
JP2021026072A
Publication Date:
September 01, 2022
Filing Date:
February 22, 2021
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK
International Classes:
G01N27/62; G01N1/28; H01J49/00; H01J49/02; H01J49/06; H01J49/14; H01J49/16; H01J49/40
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Kenichi Shibayama



 
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