Title:
クイックファスナを備える材料分析装置
Document Type and Number:
Japanese Patent JP7350130
Kind Code:
B2
Abstract:
A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.
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Inventors:
Georg Neumann
Marco Zier
Patrick Biermann
Juergen Tupper
Reinhard Schwentner
Wiebolt Voats
Markus Hilmer
leonhardt foulhammer
Stephan Lauer
Kai Dinges
Klaas Luhmann
Michael Bellman
Georg Stoch
Marco Zier
Patrick Biermann
Juergen Tupper
Reinhard Schwentner
Wiebolt Voats
Markus Hilmer
leonhardt foulhammer
Stephan Lauer
Kai Dinges
Klaas Luhmann
Michael Bellman
Georg Stoch
Application Number:
JP2022076299A
Publication Date:
September 25, 2023
Filing Date:
May 02, 2022
Export Citation:
Assignee:
Netch Guerete Bau Geembeher
International Classes:
G01N3/32; G01N19/00
Domestic Patent References:
| JP2012181048A | ||||
| JP3160783U | ||||
| JP61050038A | ||||
| JP63317739A | ||||
| JP62086536U | ||||
| JP63092239U |
Foreign References:
| US20120216624 | ||||
| US20110296668 |
Attorney, Agent or Firm:
Kenji Sugimura
Mitsutsugu Sugimura
Yoshiaki Irobe
Mitsutsugu Sugimura
Yoshiaki Irobe
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