Title:
計測処理装置、計測処理方法及びプログラム
Document Type and Number:
Japanese Patent JP6866865
Kind Code:
B2
Abstract:
A measurement processing device includes: a storage section; a first obtaining section configured to obtain a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object; a temporary storage section configured to store the first signal obtained by the first obtaining section; a second obtaining section configured to obtain a second signal which is outputted from a second device and indicates (i) a position of the measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object, the second device being different from the first device; a storage control section configured to cause the storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored in the temporary storage section; and an output control section configured to output, to a control device, at least one measurement information among the measurement information stored in the storage section.
Inventors:
Masaya Kudo
Application Number:
JP2018047620A
Publication Date:
April 28, 2021
Filing Date:
March 15, 2018
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G01D21/02; G01D9/00; G01D21/00
Domestic Patent References:
| JP5540924A | ||||
| JP200136300A | ||||
| JP201617839A |
Attorney, Agent or Firm:
Nao Murakami
Shiga International Patent Office
Shiga International Patent Office