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Patent Searching and Data


Title:
MEASUREMENT SYSTEM
Document Type and Number:
Japanese Patent JP2018151334
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a measurement system capable of measuring film electric potential distribution at a higher speed.SOLUTION: A measurement system 1 is capable of obtaining a fluorescence distribution image which is capable of simultaneously measuring fluorescence at multiple points by irradiating pattern light L1 onto tissue surface 6a. Compared to conventional measurement systems in which the fluorescence was measured one point per point, the film electric potential distribution V can be measured at a higher speed. The measurement system 1 is configured to reconstruct a sparse matrix α with a small number of nonzero elements and to calculate not-sparse film electric potential distribution V by inverse transformation. With this, using a theory of compression sensing, the film electric potential distribution V can be calculated even with fewer number of fluorescence distribution images. Therefore, since the measurement system 1 may reduce the number of the fluorescence distribution images, the processing load may be reduced, and thus the film electric potential distribution can be measured at higher speed.SELECTED DRAWING: Figure 1

Inventors:
SAKUMA ICHIRO
HARADA TAKUMI
TOMII NAOKI
Application Number:
JP2017049243A
Publication Date:
September 27, 2018
Filing Date:
March 14, 2017
Export Citation:
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Assignee:
UNIV TOKYO
International Classes:
G01N21/64; G01B11/24
Attorney, Agent or Firm:
Masayoshi Yoshida
Hiromitsu Imaeda
Umemura Hiroaki
Yasuko Yoshida