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Title:
MEASUREMENT OF VACUUM VALUE OF ION SOURCE
Document Type and Number:
Japanese Patent JPS60259924
Kind Code:
A
Abstract:

PURPOSE: To enable a vacuum value measurement in an ion source without a vacuum meter for exclusive use, by installing an electric current shock type ion source repeller or detecting a current value of an electric current flowing in a correspond unit of the repeller.

CONSTITUTION: Between a repeller 4 and a filament 8, an electric current detector 6 detecting a repeller current Ir and between a grid 14 and the filament 8 an electric current detector 18 detecting an emission current Ie are installed respectively. An electric current flow quantity of the filament 8 is so controlled that the current Ie becomes 10mA assuming a bombard voltage Vb as 200V and a repeller voltage Vr as 10V, then a distinctive dependability is brought to existence between the current Ir at the time when Ar gas is introduced and a vacuum value of an ionizing chamber. Accordingly, by obtaining preliminarily a relation between current Ir and vacuum value, measurement of the vacuum value of the ionizing chamber can be made after detection of the current Ir.


Inventors:
SHIMIZU RIYUUICHI
YAMAUCHI HIROSHI
Application Number:
JP11573984A
Publication Date:
December 23, 1985
Filing Date:
June 05, 1984
Export Citation:
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Assignee:
SHIMIZU RIYUUICHI
SHIMADZU CORP
International Classes:
G01L21/30; H01J37/08; (IPC1-7): G01L21/30
Domestic Patent References:
JPS5887439A1983-05-25
Attorney, Agent or Firm:
Noguchi Shigeo