To sufficiently correspondingly measure the positions of wefts and arrange the pattern of a woven fabric even on the production of the woven fabric, such as a woven fabric having a cross pattern, requiring the highly accurate positioning of the pattern, by monitoring the position of a mark coated on the turning point of a weft by the use of a CCD camera to detect the offset and then operating a weft pin and a weft gripper to arrange the pattern.
This method for measuring the position of a weft on the production of a woven fabric comprises coating the turning position of the weft with a marking material comprising a paste and a near IR light-absorbing substance such as activated carbon during the production of the woven fabric by the use of a shuttle-having loom 12, monitoring the weft with a CCD camera 4 on a background plate for reflecting and scattering the near IR light, treating the image to detect the coordinates of the mark position, and thus detect the offset of the weft. The method for arranging the pattern of a woven fabric comprises controlling the movement of both a weft pin and a weft gripper with a weft control mechanism and arranging the pattern through a pattern-arranging device 13. The weft pin is movably disposed and used for hooking and holding the weft. The weft gripper is used for holding and positioning the weft.
YANAI ETSURO
TAKAHASHI YASUSHI
SHICHIKU KOJI
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