Title:
MEASURING APPARATUS AND PROGRAM
Document Type and Number:
Japanese Patent JP2014153312
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a measuring apparatus allowing a measurer to easily display waveform information for a marker at an arbitrarily selected position.SOLUTION: A measuring apparatus 1 comprises: a touch panel 16 capable of detecting a touched position on a display screen 17; a storage unit 19 for storing measurement data; waveform display processing means 30 for displaying waveforms A, B on the basis of the measurement data on the display screen 17; and information display processing means 31 that displays a marker Ma1 at a touched position on the waveform A and displays on the display screen 17 an information display frame Ca1 indicating information for the waveform A corresponding to the position of the marker Ma1 and that makes a display position of the information display frame Ca1 move in response to movement of the touched position relative to the information display frame Ca1.
Inventors:
FUNAHARA IPPEI
TSUKADA HIDEKAZU
TSUKADA HIDEKAZU
Application Number:
JP2013025674A
Publication Date:
August 25, 2014
Filing Date:
February 13, 2013
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01R13/20
Domestic Patent References:
| JP2003240804A | 2003-08-27 | |||
| JP2002082133A | 2002-03-22 | |||
| JP2001305160A | 2001-10-31 | |||
| JP2013024697A | 2013-02-04 | |||
| JP2003281122A | 2003-10-03 |
Attorney, Agent or Firm:
Yoshio Komiya
Hiroyuki Onishi
Hiroyuki Onishi