Title:
MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2013088392
Kind Code:
A
Abstract:
To provide a measuring apparatus capable of performing arithmetic processing for a measurement value.
An impedance measuring apparatus 1 includes measurement control means for allowing a measurement part 2 to execute a plurality of measurement processing operations based on preset measurement conditions in predetermined order and arithmetic means for operating an input operation area 23a of an arithmetic expression input setting window 23 displayed on a touch panel 10 by using measurement values measured by the measurement part 2 in accordance the measurement conditions and performing operation by an arithmetic expression displayed on a preset arithmetic expression display area 23b.
Inventors:
SAKURAI HIRONORI
OGAWA TSUNEO
MORIKAKU TAKURO
YAMAGUCHI TSUTOMU
OGAWA TSUNEO
MORIKAKU TAKURO
YAMAGUCHI TSUTOMU
Application Number:
JP2011231748A
Publication Date:
May 13, 2013
Filing Date:
October 21, 2011
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS
International Classes:
G01R27/02; G01R27/26
Domestic Patent References:
| JP2006343111A | 2006-12-21 | |||
| JP2011169914A | 2011-09-01 | |||
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Foreign References:
| WO2008105213A1 | 2008-09-04 | |||
| US20080265912A1 | 2008-10-30 | |||
| US5072186A | 1991-12-10 |
Attorney, Agent or Firm:
Yoshio Komiya
Hiroyuki Onishi
Minoru Nakayama
Hiroyuki Onishi
Minoru Nakayama