MEASURING DEVICE AND MEASURING METHOD EMPLOYING THE SAME

Title:

MEASURING DEVICE AND MEASURING METHOD EMPLOYING THE SAME

Document Type and Number:

Japanese Patent JP2013150132

Kind Code:

A

Abstract:

To provide a measuring device capable of performing high-accuracy measurement on a data converter.

A measuring device 1 is the measuring device 1 for an A/D converter 2 including a comparator which compares a voltage or a current generated by combining a plurality of physical quantities with an input voltage Vi and comprises an input voltage generation section 11 which generates the input voltage Vi of which the voltage level changes linearly, and a measurement and calculation section 12 which fetches a digital value Vo outputted from the A/D converter 2, selects a plurality of pairs of digital values Vo corresponding to the presence/absence of the physical quantities one by one as a calculation target pair in order, calculates a differential voltage of each input voltage pair corresponding to the calculation target pair, and calculates an estimate (second estimate) of the input voltage Vi corresponding to the digital voltage Vo on the basis of a result of performing statistic processing on such a differential voltage.

Inventors:

ISHIHARA NORIKAZU
MORI YUKI
SUGAWARA MITSUTOSHI

Application Number:

JP2012008630A

Publication Date:

August 01, 2013

Filing Date:

January 19, 2012

Export Citation:

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Assignee:

RENESAS ELECTRONICS CORP
SUGAWARA MITSUTOSHI

International Classes:

H03M1/10; H03M1/44

Domestic Patent References:

JP2007274488A	2007-10-18
JP2008017004A	2008-01-24

Attorney, Agent or Firm:

Ken Ieiri

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