Title:
MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2001208734
Kind Code:
A
Abstract:
To measure a sample at an appropriate input level by a simple operation by applying a measuring device to a viscoelastic measuring device, etc., to detect the response characteristics, for example, of a solid sample by various parameters.
The response to stimuli is processed by wavelet transform and judged.
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Inventors:
TSUKAMOTO KOKI
Application Number:
JP2000018048A
Publication Date:
August 03, 2001
Filing Date:
January 25, 2000
Export Citation:
Assignee:
A & D CO LTD
International Classes:
G01N29/09; G01N3/00; G01N11/00; (IPC1-7): G01N29/16; G01N11/00
Attorney, Agent or Firm:
Shigenori Tada