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Patent Searching and Data


Title:
MEASURING INSTRUMENT AND MEASURING METHOD FOR CHARGED PRESSURE
Document Type and Number:
Japanese Patent JP2004156943
Kind Code:
A
Abstract:

To provide a charged pressure measuring instrument wherein a pressure change, time, a flow rate, and temperature are measured to calculate the charged pressure from the physical properties of a gas, thereby enhancing the measurement accuracy of the charged pressure.

This charged pressure measuring instrument 1 for measuring a charged pressure in a pressure vessel 21 such as an accumulator, has a means for pressurizing the interior of the pressure vessel by pressing a fluid into a fluid chamber 25 of the pressure vessel 21, a means for measuring a flow rate, time, pressure, and temperature during the pressurization by the pressurizing means, and a personal computer 8 for collecting and computing measurement data obtained by the measuring means.


Inventors:
MIZUKAWA DAISUKE
Application Number:
JP2002320943A
Publication Date:
June 03, 2004
Filing Date:
November 05, 2002
Export Citation:
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Assignee:
NOK CORP
International Classes:
G01L11/00; F15B1/08; F15B19/00; (IPC1-7): G01L11/00; F15B1/08; F15B19/00
Attorney, Agent or Firm:
Yoichi Nomoto