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Title:
MEASURING INSTRUMENT, SYSTEM FOR ADJUSTING SURFACE OUTLINE, AND SYSTEM AND SHEET FOR DISCRIMINATING SURFACE LOAD
Document Type and Number:
Japanese Patent JP2002243430
Kind Code:
A
Abstract:

To find the size of a bag filled with a medium without depending upon external temperature nor other influence by providing a measuring instrument and to provide a system for adjusting a surface outline and a system and a system for discriminating a surface load.

A measuring instrument which detects the size of the bag filled with the medium is provided with a detector; and this detector is in contact with the outer skin of the bag or buried in a material surrounding the outer skin. The detector cooperates with a sensor, which finds the position of the detector about a reference point or reference surface and a value or information corresponding to the found interval between the detector and the reference surface or reference point is outputted by the measuring instrument. The surface outline adjustment system, the surface load discrimination system, and the sheet use this measuring instrument.


Inventors:
GARBER ROLAND
MOSER RICHARD
COLDITZ STEFFEN
Application Number:
JP2001398139A
Publication Date:
August 28, 2002
Filing Date:
December 27, 2001
Export Citation:
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Assignee:
ASF THOMAS IND GMBH
International Classes:
A47C27/08; A47C27/10; A47C31/12; B60N2/90; G01F17/00; G01B21/16; (IPC1-7): G01B21/16; A47C27/08; A47C27/10; A47C31/12; B60N2/44
Attorney, Agent or Firm:
Toshio Yano (4 outside)