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Title:
MEASURING METHOD AND DEVICE OF SURFACE SHAPE OF SPECIMEN
Document Type and Number:
Japanese Patent JP2007298281
Kind Code:
A
Abstract:

To provide a measuring method and a measuring device capable of measuring highly accurately the surface shape of a specimen.

In this device equipped with a means for splitting a light flux emitted from a light source, one split light flux is allowed to enter a specimen surface 6, and the other light flux is allowed to enter a reference surface 7, and reflected light from the specimen surface 6 and reflected light from the reference surface 7 are allowed to interfere with each other, and the surface shape of the specimen is measured based on an interference fringe acquired thereby. A means for allowing oblique incidence allows oblique incidence of the light flux into the specimen surface 6 and the reference surface 7 at a prescribed angle. A detection means detects the interference fringe acquired by interference between the reflected light from the specimen surface 6 and the reflected light from the reference surface 7. A means for calculating shape information calculates the shape information of the specimen based on information on the interference fringe detected by the detection means and the angle of oblique incidence.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
YANAGI SHIKIYO
Application Number:
JP2006123893A
Publication Date:
November 15, 2007
Filing Date:
April 27, 2006
Export Citation:
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Assignee:
NIKON CORP
International Classes:
G01B11/24; G01B9/02; G01M11/00
Attorney, Agent or Firm:
Takao Watanabe
Keiji Osawa