Title:
MEASURING METHOD, MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING PROGRAM
Document Type and Number:
Japanese Patent JP2021148538
Kind Code:
A
Abstract:
To provide a measuring method that can estimate an integration error in integrating the acceleration of a movable body acting on a structure and accurately calculate the waveform of displacement of the structure.SOLUTION: A measuring method includes the steps of: acquiring first observation point information including the time at which parts of a movable body pass through first to N-th observation points and physical quantities; acquiring second observation point information including the time at which the parts pass through the N+1-th to N2-th observation points and physical quantities; calculating a deflection waveform of an j-th path through which the movable body travels based on a movable body deflection waveform obtained by adding the deflection waveforms of the structure caused by the parts; calculating deflection waveforms of a first to N-th paths from correlation coefficients of displacement of the first to N-th paths based on the deflection waveform of the j-th path; and correcting displacement waveforms of 2N+1 to 3N-th observation points based on the deflection waveforms of the first to N-th paths.SELECTED DRAWING: Figure 24
Inventors:
KOBAYASHI SACHIHIRO
Application Number:
JP2020047311A
Publication Date:
September 27, 2021
Filing Date:
March 18, 2020
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01M5/00; E01D2/00; E01D19/02; G01B21/00; G08G1/015
Attorney, Agent or Firm:
Kazuaki Watanabe
Satoshi Nakai
Hiroki Matsuoka
Satoshi Nakai
Hiroki Matsuoka