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Title:
MEASURING METHOD
Document Type and Number:
Japanese Patent JP2015227893
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a measuring method capable of evaluating surface wettability of an object, at high speed in a nondestructive manner.SOLUTION: A measuring method related to a certain situation includes: a step for irradiating an object OBJ with ultraviolet rays; a step for detecting fluorescence produced in the object OBJ; and a step for outputting a value showing the surface wettability of the object from intensity of the detected fluorescence. A separate measurement method related to another situation includes: a step for irradiating the object with the ultraviolet rays; a step for detecting the fluorescence produced in the object; and a step for outputting intensity of the fluorescence detected as a value showing the surface wettability of the object.

Inventors:
TOMITA KOHEI
TAKAMATSU YOSHIHISA
TAKAICHI RYUICHIRO
NAKAMUNE KENICHI
HASEBE YOJI
Application Number:
JP2015182724A
Publication Date:
December 17, 2015
Filing Date:
September 16, 2015
Export Citation:
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Assignee:
SENTEKKU KK
International Classes:
G01N21/64; G01N13/00
Domestic Patent References:
JPH0474525A1992-03-09
JP2001305052A2001-10-31
JP2002216736A2002-08-02
JP2005233721A2005-09-02
Other References:
JPN7016002517; ITAGAKI Hideyuki et al.: '"Initial Process in the Radiation-induced Degradation of Poly (ethlen telephthalate) Detectde by Flu' Journal of Photopolymer Science and Technology Vol.11,No.1, 1998, pp.17-18
JPN7016002518; ABDUL-KADER A.M. et al.: '"Surface free energy of ultra-high molecular weight polyethlene modified by electron and gamma irrad' Applied Surface Science Vol.255, 2009, pp.7786-7790
JPN7016002515; 八木 誠人 他: '"高分子材料の放電プラズマ表面改質におけるフォトルミネセンスによるその場検出への応用"' 電気学会論文誌 Vol.120-A,No.11, 2000, 994〜999頁
JPN7016002516; LI jun et al.: '"Chemical Modification of Poly (ethyleneterephthalate) Surface by the Selective Alkylation of Acid S' Macromolecular Chemistry and Physics Vol.203,No.17, 2002, pp 2470-2474
Attorney, Agent or Firm:
Fukami patent office