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Title:
MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2016082471
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a measurement method capable of efficiently obtaining temperature characteristics of an oscillation frequency of a crystal oscillator including influences of self-heating.SOLUTION: A temperature around the crystal oscillator is changed multiple times, and the temperature characteristics of the crystal oscillator are calculated based on a plurality of oscillation frequencies which are observed when the crystal oscillator is temporarily electrified at the temperatures. After the temperature around the crystal oscillator is set to any one specific temperature among the temperatures, the oscillation frequency in the case where an electrification state of the crystal oscillator is maintained is observed. On the basis of the temperature characteristics calculated from the observation result in the case where the crystal oscillator is temporarily electrified and the oscillation frequency which is observed when the electrification state is maintained at the specific temperature, the temperature characteristics of the oscillation frequency in the case where the electrification state of the crystal oscillator is maintained are calculated. The temperature characteristics of the oscillation frequency in the case where the electrification state of the crystal oscillator is maintained are normalized by a predetermined temperature.SELECTED DRAWING: Figure 4D

Inventors:
KISHI SHOICHI
KUBOTA HAJIME
ITO MASAYUKI
Application Number:
JP2014213611A
Publication Date:
May 16, 2016
Filing Date:
October 20, 2014
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
H03B5/32; G01K7/32; G01K15/00
Domestic Patent References:
JP2013243481A2013-12-05
JP2008157751A2008-07-10
JPH10261919A1998-09-29
JP2013143601A2013-07-22
Foreign References:
US20030176204A12003-09-18
US20140140364A12014-05-22
Attorney, Agent or Firm:
Akira Hirakawa
Daisuke Takada