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Title:
Measuring probe
Document Type and Number:
Japanese Patent JP6216400
Kind Code:
B2
Abstract:
A measuring probe(300) includes: a stylus(336) having a contact part (362) to be brought into contact with an object to be measured; a probe housing(300) capable of supporting the stylus(336) on an axial center(O); and a detection element(325) capable of detecting a movement of the contact part(362). The measuring probe (300) further includes: two supporting members (322, 324) disposed in an axial direction(O) of the probe housing(306), the supporting member(322, 324) allowing for an attitude change of the stylus (336) ; and a coupling shaft (326) for coupling the two supporting members(322, 324) together. The detection element(325) is disposed in one of the two supporting members(322, 324) that is farthest away from a rotational center position (RC) of rotation generated in the stylus (336) when a measuring force (F) is applied to the contact part (336) from a direction perpendicular to the axial direction(O), to detect a strain amount of the one of the two supporting members(322, 324). The measuring probe(300) having a simple structure and capable of ensuring high measurement sensitivity is thus provided.

Inventors:
Satoshi Koga
Akinori Saito
Hiroyuki Kanamori
Kuriyama Yutaka
Nobuhiro Ishikawa
Application Number:
JP2016036472A
Publication Date:
October 18, 2017
Filing Date:
February 26, 2016
Export Citation:
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Assignee:
Mitutoyo Corporation
International Classes:
G01B5/00; G01B21/00
Domestic Patent References:
JP5332766A
JP3140476U
Foreign References:
US5509211
Attorney, Agent or Firm:
Satoshi Takaya
Keisuke Matsuyama
Tsuyoshi Makino
Takashi Fujita
Shuzo Sudo