Title:
MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP3415745
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain a measuring system by which the generation of an abnormal state and its cause are grasped easily by a method wherein the generation time of an abnormal signal, the content of the abnormal state and whether the abnormal state is eliminated or not are stored and a stored conent is displayed.
SOLUTION: A measuring system is provided with many measuring means 11 to 1m which compute a measured value, a microcomputer 2 which is built in a personal computer, a display part 3, and an operation part 4. The microcomputer 2 is provided with a CPU 5, a memory 6, and the like. The memory 6 is provided with a RAM 60 and with a ROM 61. The RAM 60 stores the generation time end the elimination time of an abnormal signal, a measuring means in which the abnormal signal is generated and the content of an abnormal state. The CPU 5 is provided with a new abnormality discrimination means 50, an abnormality-elimination discrimination means 51, a write means 52, a display control means 54, and the like. The write means 52 stores the content and the time of the abnormal signal on the ROM 60. The operation part 4 sets an abnormality display mode in which an abnormality history is displayed on, e.g. the display part 3. The display control means 54 controls the content stored on the RAM 60 so as to be displayed on the display part 3.
Inventors:
Yasuyuki Sado
Application Number:
JP13756897A
Publication Date:
June 09, 2003
Filing Date:
May 12, 1997
Export Citation:
Assignee:
HORIBA, Ltd.
International Classes:
G01D1/18; G01M15/00; G01M15/04; (IPC1-7): G01D1/18; G01M15/00
Domestic Patent References:
| JP62232096A | ||||
| JP481138B2 |
Attorney, Agent or Firm:
Yoshinobu Yamamura
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