To solve problems in a probe block by a conventional technology which comprises a plurality of pins and can not provide satisfying conductivity when electrically connected, has an inclination of a needle head of each of the pins for joining to a test pad sufficiently, to damage the test pad and to give trouble in a back-end process in testing, and further cost for repairing the probe block by the conventional technology which is expensive.
A membrane probe block comprises a circuit sub-assembly having a plurality of test pads, and a circuit having a flexible printed circuit unit 502. The block further includes a suspending unit 300. A driver integrated circuit unit 200 is electrically connected to the circuit sub-assembly, and the flexible printed circuit unit 502 is electrically connected to the driver integrated circuit unit 200.
RAI UTSUKAI
KAKU KENGEN
SHA TOSON
CHIN RYUKIN
HAN IHO
O MEIKEN
RIN KOCHU
RYU BUNGEN
