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Title:
METHOD AND APPARATUS FOR ANALYZING DISTRIBUTION, METHOD AND APPARATUS FOR ESTIMATING ABNORMAL EQUIPMENT, PROGRAM FOR ALLOWING COMPUTER TO EXECUTE DISTRIBUTION ANALYZING METHOD OR ABNORMAL EQUIPMENT ESTIMATION METHOD AND RECORDING MEDIUM CAPABLE OF READING COMPUTER ON WHICH PROGRAM IS RECORDED
Document Type and Number:
Japanese Patent JP2008151585
Kind Code:
A
Abstract:

To perform evaluation of high precision in a distribution analyzing method for evaluating whether analyzing target data having characteristics distributed along a plane is similar to a specific distribution shape pattern.

The distribution shape pattern is defined by demarcating the plane corresponding to an analyzing target data decided plane into a plurality of rectangular regions in a lattice like state and imparting a density value for acquiring a multivalue in a certain numerical value range so as to show the relative magnitude relation of the characteristic value of the analyzing target data (S101). The density value of the distribution shape pattern is adjusted so that the magnitude of the characteristic value of a characteristic data group is reflected to the evaluation by using the characteristic value of a predetermined distribution shape pattern adjustment characteristic data group (S102 and S103). The analyzing target data is compared with the distribution shape pattern after adjustment to calculate the quantitative similarity of the distribution of the characteristic value of the analyzing target data and of the distribution of the density value of the distribution shape pattern after adjustment (S104).


Inventors:
Imai, Katsuki
Application Number:
JP2006000338583
Publication Date:
July 03, 2008
Filing Date:
December 15, 2006
Export Citation:
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Assignee:
SHARP CORP
International Classes:
G01N21/956; G06T1/00



 
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