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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR DETECTING ORIENTATION OF SINGLE CRYSTAL
Document Type and Number:
Japanese Patent JPH04264241
Kind Code:
A
Abstract:

PURPOSE: To detect an OF orientation highly efficiently and highly accurately with a simple structure.

CONSTITUTION: While a single crystal ingot W is rotated, its crystal habit line is optically detected by a crystal habit line detecting sensor 14, and the rotation of the single crystal ingot W is stopped when the crystal habit line is detected. Then while the single crystal ingot W is rotated in a predetermined direction at very slow speed, its crystal axis is detected by an X-ray apparatus 9. Although determination of an OF orientation by means of X-rays is usually possible by applying X-rays from a plurality of directions or by varying application angles of the X-rays, use of the crystal habit line of the crystal allows detection of the OF orientation in a short time with high efficiency and high accuracy since single detection of the crystal axis orientation by the X-ray apparatus 9 is sufficient. In addition, only a comparatively inexpensive crystal habit line detecting sensor 14 is attached to a single X-ray apparatus 9 as a detector, so that the detector can be simplified in structure and reduced in cost.


Inventors:
IBE HIROYUKI
TERAJIMA SEIICHI
MASUI TSUMORU
Application Number:
JP4545891A
Publication Date:
September 21, 1992
Filing Date:
February 19, 1991
Export Citation:
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Assignee:
SHINETSU HANDOTAI KK
International Classes:
G01N23/20; G01N23/207; (IPC1-7): G01N23/207
Attorney, Agent or Firm:
Koichi Tateno