Title:
METHOD AND APPARATUS FOR DETECTING WORK FLAW
Document Type and Number:
Japanese Patent JP2002039958
Kind Code:
A
Abstract:
To improve an accuracy for detecting flaws with improving a production efficiency by shortening a cleaning time and simplifying a cleaning facility when flaws of work surfaces are to be detected.
In the method for detecting flaws by processing images of the work surface, when it is distinguished by the image processing that there is a flaw image, the work surface is cleaned and images of the surface are taken again to carry out the image processing again. When a position of the flaw image is moved after the succeeding image processing, the flaw image is regarded as dust and the work surface is determined to have no flaw.
Inventors:
Yamaura, Takaaki
Application Number:
JP2000000229806
Publication Date:
February 06, 2002
Filing Date:
July 28, 2000
Export Citation:
Assignee:
SHOWA CORP
International Classes:
G01N21/952; B08B1/00; B08B1/04; B08B5/02; G01N21/88; B08B1/00; B08B1/04; B08B5/02; (IPC1-7): G01N21/952; B08B1/00; B08B1/04; B08B5/02