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Title:
METHOD AND APPARATUS FOR FORMING THIN FILM ON SURFACE OF SEMICONDUCTOR SUBSTRATE
Document Type and Number:
Japanese Patent JPH01319944
Kind Code:
A
Abstract:

PURPOSE: To eliminate contaminant etc., without washing, eliminate an oxide film without damaging a substrate, and form a thin film without exposing to the air by eliminating organic contaminant, etc., stuck to the surface of the semiconductor substrate and then forming a thin film on the cleaned surface.

CONSTITUTION: A semiconductor substrate 13 is exposed to an atmosphere including oxidizing gas and a light is applied to the substrate 13 while heated to oxidize the surface of the substrate 13 by photochemical reaction, and eliminate harmful organic contaminant etc., 20 which may be stuck to the surface of the substrate 13. At the same time, an extremely thin oxide film 21 to take a harmful metal pollution layer or surface damaging layer thereinto is grown on the surface of the substrate 13. The oxide film 21 is eliminated by applying a light in an atmosphere including chloric gas to expose the cleaned surface of the substrate, and a thin film 22 is formed continuously on the cleaned surface without exposing to the air.


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Inventors:
TSUKAMOTO KATSUHIRO
TOKUI AKIRA
Application Number:
JP15411888A
Publication Date:
December 26, 1989
Filing Date:
June 21, 1988
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
H01L21/20; H01L21/306; H01L21/316; H01L21/318; (IPC1-7): H01L21/316
Domestic Patent References:
JPS63120428A1988-05-24
JPS62293727A1987-12-21
JPS61139034A1986-06-26
Attorney, Agent or Firm:
Mamoru Takada