Title:
METHOD AND APPARATUS FOR INSPECTING PIXEL DEFECT OF SOLID-STATE IMAGING DEVICE
Document Type and Number:
Japanese Patent JP2007060561
Kind Code:
A
Abstract:
To accurately and surely detect a defective pixel in a solid-state imaging device.
A pixel defect inspecting apparatus 3 comprises a light source 6, an optical lens 7, a timing generator 8, a signal processing part 9, a system controller 10, an arithmetic circuit 11, a memory 12, and an interface part 13. Image data outputted from a solid-state imaging device 2 driven by the timing generator 8 are signal-processed by the signal processing part 9 and stored in the memory 12. Image data read from the memory 12 are averaged by the arithmetic circuit 11, a ratio of luminance levels before and after averaging is calculated, and a defective pixel is detected from a value of the ratio.
Inventors:
UTSUMAKI TAKEYOSHI
Application Number:
JP2005246467A
Publication Date:
March 08, 2007
Filing Date:
August 26, 2005
Export Citation:
Assignee:
FUJIFILM CORP
International Classes:
H01L27/14; H04N5/367; H04N5/376; H04N5/378; H04N17/00
Attorney, Agent or Firm:
Kazunori Kobayashi
Shigeru Iijima
Kobayashi Hideyoshi
Shigeru Iijima
Kobayashi Hideyoshi
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