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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASUREMENT OF RESIDUAL STRESS AT INSIDE OF OBJECT
Document Type and Number:
Japanese Patent JP2003042859
Kind Code:
A
Abstract:

To provide a method and an apparatus for the measurement of the residual stress at inside of an object wherein the internal residual stress of an actual structure such as an apparatus, a structure or the like can be evaluated simply and nondestructively.

The measuring apparatus comprises a step in which the object is divided into elements; a step in which the residual stress on the surface of the object is measured; a step in which a residual-stress generation source is used as an object force in a first relational expression indicating the relationship with the object force, a traction acting on the surface of the object and a displacement due to it, and in a second relational expression indicating the relationship with the object force, the traction acting on the surface of the object, and a stress in an arbitrary position on the surface of the object, and in which the first and second relational expressions are apposed so as to solve the distribution of an unknown boundary amount and the residual-stress generation source; and a step in which the residual stress in an arbitray position at the inside of the object is found on the basis of the object force, the traction on the surface of the object and the displacement.


Inventors:
ASANO MASAYUKI
ITAYA MASAO
KIKUCHI MASAAKI
Application Number:
JP2001231768A
Publication Date:
February 13, 2003
Filing Date:
July 31, 2001
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
G01L1/00; (IPC1-7): G01L1/00
Attorney, Agent or Firm:
Kenji Yoshitake (5 others)