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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING CHANGE OF FREQUENCY WITH TIME OF OSCILLATING ELEMENT
Document Type and Number:
Japanese Patent JPH09304448
Kind Code:
A
Abstract:

To provide a method and an apparatus whereby a frequency change with time of a quartz oscillator can be measured in a short time surely.

According to the method for measuring frequency change with time of an oscillating element (for instance, quartz oscillator), based on a characteristic of an change with time of an oscillation frequency to a reference frequency of the oscillating element (S1), a characteristic of the change with time of the frequency corresponding to a power of a lapsed time is obtained for every factor influencing the change with time of the frequency of the oscillating element (S3-S5), and an evaluation formula for the characteristic of the change with time of the frequency of the oscillating element is calculated based on the characteristic for every factor (S6-S11).


Inventors:
MOMOZAKI EIJI
KOBAYASHI SACHIHIRO
Application Number:
JP12065096A
Publication Date:
November 28, 1997
Filing Date:
May 15, 1996
Export Citation:
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Assignee:
SEIKO EPSON CORP
International Classes:
G04D7/00; G01R23/02; G01R29/22; H03H3/007; H03H3/04; (IPC1-7): G01R23/02; G04D7/00; H03H3/04
Attorney, Agent or Firm:
鈴木 喜三郎 (外1名)