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Title:
METHOD AND APPARATUS FOR MEASURING SUB-VIBRATION OF CRYSTAL RESONATOR, AND METHOD FOR MANAGING MACHINING OF CRYSTAL RESONATOR
Document Type and Number:
Japanese Patent JP3959723
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring sub-vibration for distinguishing a plurality of sub-vibration modes of a crystal resonator, and to provide a method for managing a machining of the crystal resonator by using a barrel machining on the basis of the result measured by the apparatus.
SOLUTION: The apparatus is provided with a plurality of electrodes 41 and 42 located in accordance with a specific vibration domain of a crystal resonator 10 and a means for measuring a frequency corresponding to the plurality of sub-vibration modes of the crystal resonator 10 via the measuring electrodes, such that a kind of the sub-vibration mode which is observed with a predetermined frequency difference from main vibration of the crystal vibrator is specified.


Inventors:
Kimiki Shiga
Kenichi Kasahara
Application Number:
JP2003404924A
Publication Date:
August 15, 2007
Filing Date:
December 03, 2003
Export Citation:
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Assignee:
Seiko Epson Corporation
International Classes:
H03H3/02; (IPC1-7): H03H3/02
Domestic Patent References:
JP63015510A
JP10166260A
JP2001183310A
JP2003057282A
Attorney, Agent or Firm:
岡▲崎▼ 信太郎
Arai Zen