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Title:
METHOD AND APPARATUS FOR MEASURING THICKNESS
Document Type and Number:
Japanese Patent JPS63106505
Kind Code:
A
Abstract:
PURPOSE:To easily measure a thickness, by a method wherein light is projected on the surface of the article to be measured running on a reference surface curved into an arch shape and the reflected light from the surface of the article to be measured of said light is received to measure the thickness of the article to be measured from the light receiving position. CONSTITUTION:Strip like cloth 3 is placed on a reference surface 2 so that the longitudinal direction thereof is aligned from one end 1a to the other end 1b and a frame 9 is moved up and down along a support rod 10 so that the both left and right side edge parts of the cloth 3 along the longitudinal direction is lightly pressed by the close contact rollers 6 at four corners of a frame 4 and located at a proper position to be fixed. The cloth 3 is pulled to the side of the other end 1b of the reference surface 2 to be allowed to continuously run. Next, light is projected on the surface of the central part of the cloth 3 in the lateral direction thereof from the light projection device in a displacement sensor 13 and the reflected light from the surface of the cloth 3 is formed into an image on the light position detection element 18 in the sensor 13. The distance between the image forming position and the reference position preset on the element 18 is detected and the distance value is calculated by an operation apparatus and the thickness of the cloth 3 is displayed on a thickness display meter.

Inventors:
TAKAHASHI SHOJI
SUZUKI KOZO
NAGAI KENJI
FUJIMOTO HARUTO
Application Number:
JP25253486A
Publication Date:
May 11, 1988
Filing Date:
October 22, 1986
Export Citation:
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Assignee:
KANEBO LTD
International Classes:
G01B11/06; (IPC1-7): G01B11/06
Attorney, Agent or Firm:
Nishihiko Yasuhiko