To simplify a constitution, and enhance measurement resolution for measuring a three-dimensional shape.

A method for measuring the three-dimensional shape irradiates a measured object with a binarized projection pattern, and measures the three-dimensional shape of the measured object based on an image of the measured object on which the binarized projection pattern is projected. The predetermined binarized projection pattern is sequentially projected on the measured object as it is shifted by a predetermined movement. A first type of the image of the measured object on which the predetermined binarized projection pattern is projected is obtained every time it is shifted. A plurality of the different binarized projection patterns are projected on the measured object. A second type of the image of the measured object on which a plurality of the different binarized projection patterns are projected is obtained every time a plurality of the different binarized projection patterns are projected. The three-dimensional shape is obtained based on the first and second types of the images.